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Karsten Kunze: Katalogdaten im Herbstsemester 2016

NameHerr Dr. Karsten Kunze
Adresse
ScopeM
ETH Zürich, HPM D 46
Otto-Stern-Weg 3
8093 Zürich
SWITZERLAND
Telefon+41 44 632 56 95
E-Mailkarsten.kunze@scopem.ethz.ch
DepartementErdwissenschaften
BeziehungDozent

NummerTitelECTSUmfangDozierende
327-0702-00LEM-Practical Course in Materials Science2 KP4PK. Kunze, F. Gramm, F. Krumeich, J. Reuteler
KurzbeschreibungPraktische Arbeit am TEM und SEM, selbständiges Bearbeiten von typischen Fragestellungen, Auswertung der Daten, Schreiben eines Reports und Lernjournal
LernzielAnwendung grundlegender elektronenmikroskopischer Techniken im Bereich materialwissenschaftlicher Fragestellungen
Literatursiehe LE Electron Microscopy (327-0703-00L)
Voraussetzungen / BesonderesVoraussetzung: erfolgreicher Besuch der LE Electron Microscopy (327-0703-00L), Maximale Teilnehmerzahl 15, Arbeit in 3-er Gruppen.
327-0703-00LElectron Microscopy in Material Science4 KP2V + 2UK. Kunze, R. Erni, S. Gerstl, F. Gramm, F. Krumeich
KurzbeschreibungA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
LernzielA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
InhaltThis course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported.
SkriptEnglisch
LiteraturTransmission Electron Microscopy, L. Reimer; Einführung in die Elektronenmikroskopie, M. v. Heimendahl. Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996. Hawkes, Valdrè: Biophysical Electron Microscopy, Academic Press, 1990.
Frank: Electron Tomography, Plenum Press, 1992.
Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015)
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Belegung eingeschränkt - Details anzeigen
Number of participants limited to 6.
The participants will be chosen based on a short motivation letter. Please send this letter to S. Rodighiero (main lecturer) as soon as possible.
1 KP3PS. Rodighiero, A. G. Bittermann, K. Kunze, J. Reuteler
KurzbeschreibungDer Einführungskurs in Rasterelektronenmikroskopie (SEM) betont praktisches Lernen. Die Studierenden haben die Möglichkeit an zwei Elektronenmikroskopen ihre eigenen Proben oder Standard-Testproben zu untersuchen, sowie von ScopeM-Wissenschafler vorbereitete Übungen zu lösen.
Lernziel- Set-up, align and operate a SEM successfully and safely.
- Accomplish imaging tasks successfully and optimize microscope performances.
- Master the operation of a low-vacuum and field-emission SEM and EDX instrument.
- Perform sample preparation with corresponding techniques and equipment for imaging and analysis
- Acquire techniques in obtaining secondary electron and backscatter electron micrographs
- Perform EDX qualitative and semi-quantitative analysis
InhaltDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized.

- Discussion of students' sample/interest
- Introduction and discussion on Electron Microscopy and instrumentation
- Lectures on electron sources, electron lenses and probe formation
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM
- Brief description and demonstration of the SEM microscope
- Practice on beam/specimen interaction, image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping
- Practice on real-world samples and report results
Literatur- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
651-1851-00LEinführung in die Rasterelektronenmikroskopie
Findet dieses Semester nicht statt.
1 KP2GK. Kunze, L. Martin
Kurzbeschreibung
LernzielEinführung in die Rasterelektronenmikroskopie und Mikrobereichsanalyse. Erwerb praktischer Fertigkeiten in der selbständigen Bedienung eines REM.
InhaltFunktionsweise und die wesentlichen Betriebsarten eines Rasterelektronenmikroskopes. Methoden und Einsatzzwecke zur
- Abbildung (SE, BSE, FSE, AE, KL),
- Röntgen-Spektroskopie (EDX),
- Elektronen-Beugung (EBSD, Channeling, Orientation Imaging).
Methoden zur Probenpräparation.
Praktische Übungen
SkriptBeilagen und Bedienungsunterlagen werden während des Kurses abgegeben
Literatur- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996).
- Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994).
- Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973).
- Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981).
Voraussetzungen / BesonderesGanztägiger Blockkurs nach Ende des HS
651-4111-00LRock Physics Information 3 KP2GA. S. Zappone, K. Kunze, C. Madonna
KurzbeschreibungThe modern discipline of Rock Physics serves as a bridge between traditional Rock Mechanics and traditional Rock Physical Property measurement. Through understanding the physics of the process, we strive to better understand other related fields such as structural geology and geophysics.
LernzielThe objective of this course is to introduce Rock Physics as a laboratory and interpretive tool.
InhaltThe course will consists of regular classes, with a small number of laboratory demonstrations made on an ad-hoc basis (depending on equipment and research objective schedules at the Rock Deformation Laboratory). The course will cover measurements of physical properties of rock such as density, porosity, permeability and elastic wave velocity, and will introduce the concept of seismic seismic anisotropy etc. Later we will cover rock deformation in the brittle field, earthquake physics and triggering. Finally we will discuss scale effects as we move from small scale laboratory environment to the scale of the geophysical investigation.
Voraussetzungen / BesonderesUndergraduate courses in the following subjects are highly recommended in order to get the most out of this specialist course:

- Basic structural Geology
- Geophysics