Antonella Rossi Elsener-Rossi: Catalogue data in Spring Semester 2021

Name Dr. Antonella Rossi Elsener-Rossi
Address
Professur Magnetismus u. Grenzfl.
ETH Zürich, HPP P 21
Hönggerbergring 64
8093 Zürich
SWITZERLAND
Telephone+41 44 632 59 04
E-mailantonella.rossi@mat.ethz.ch
DepartmentMaterials
RelationshipLecturer

NumberTitleECTSHoursLecturers
327-2221-00LAdvanced Surface Characterisation Techniques4 credits2V + 2UA. Rossi Elsener-Rossi
AbstractThis course will be dedicated to the application of surface analytical techniques for the characterization of nanostructured materials and the understanding of their reactivity. Applications to innovative materials relevant for industries will be provided during the course.
ObjectiveAcquisition of a sound basis on qualitative and quantitative analysis of XPS, AES and SIMS data based on practical examples and exercises from tribology, polymer science, biomaterials, passivity, nanostructured materials (according to the interests of participants).

Learn the capabilities and limitations of the techniques for materials characterization.
ContentXPS and AES: Instrumental parameters (sources, analyzer); data acquisition; energy and intensity calibration; data processing (satellite subtraction, background subtraction, curve-fitting); qualitative analysis (BE shifts, satellites); quantitative analysis of homogeneous, layered and nanostructured surfaces.

Examples will cover chemical, physical, & electrical characterization of films, surfaces, particles & interfaces.

Errors in quantitative analysis; transmission function, comparison of data from different instruments; depth-profiling techniques; imaging acquisition and processing

SIMS: Principle of the technique; overview on the instrumentation: Choice of primary ion; Mass scale calibration; Linearity of the intensity scale (dead-time correction); Repeatability and reproducibility; an introduction to data interpretation and multivariate techniques will be also provided.

Composition depth-profiling by XPS and Auger over 100's nm is presented by using noble gas ions (e.g. Ar+) sputtering while acquiring spectra. The advantages and limitations of depth-profiling with C60 source that reduces or eliminates sputter induced artifacts for organic materials will be discussed.
Angle Resolved XPS in combination with mathematical methods can provide gradient and layer ordering information within the first monolayers down to 10 nm:practical examples will be presented.

ISO and ASTM standards will be also presented during the course.

Case studies, Visit to the laboratory, Computer-assisted data processing in the classroom.
Lecture notesCopy of the overheads will be available after the lecture.

Papers used for the case studies will be also distributed.
LiteratureD. Briggs, Surface analysis of polymers by XPS and static SIMS, Cambridge Solid State Science Series, 1998

J.C. Riviere and S. Myhra, Handbook of surface and Interface Analysis, Marcel Dekker Inc.

D. Briggs and M.P. Seah, Practical Surface Analysis, vol.1, John Wiley & Sons, Chichester.

J.C. Vickerman, Surface Analysis - the principal techniques, John Wiley & Sons, Chichester.
Prerequisites / NoticeThe students should have attended and passed the following exams:
general chemistry, general physics and an introductory course on surface analysis techniques.