Luiz Grafulha Morales: Katalogdaten im Frühjahrssemester 2021

NameHerr Dr. Luiz Grafulha Morales
Adresse
ScopeM
ETH Zürich, HPM C 57.3
Otto-Stern-Weg 3
8093 Zürich
SWITZERLAND
Telefon+41 44 633 37 46
E-Mailluiz.morales@scopem.ethz.ch
DepartementErdwissenschaften
BeziehungDozent

NummerTitelECTSUmfangDozierende
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Belegung eingeschränkt - Details anzeigen
Limited number of participants.

Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee. (http://www.scopem.ethz.ch/education/MTP.html).

Registration form: (Link)
2 KP3PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, J. Reuteler
KurzbeschreibungDer Einführungskurs in Rasterelektronenmikroskopie (SEM) betont praktisches Lernen. Die Studierenden haben die Möglichkeit an zwei Elektronenmikroskopen ihre eigenen Proben oder Standard-Testproben zu untersuchen, sowie von ScopeM-Wissenschafler vorbereitete Übungen zu lösen.
Lernziel- Set-up, align and operate a SEM successfully and safely.
- Accomplish imaging tasks successfully and optimize microscope performances.
- Master the operation of a low-vacuum and field-emission SEM and EDX instrument.
- Perform sample preparation with corresponding techniques and equipment for imaging and analysis
- Acquire techniques in obtaining secondary electron and backscatter electron micrographs
- Perform EDX qualitative and semi-quantitative analysis
InhaltDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized.

- Discussion of students' sample/interest
- Introduction and discussion on Electron Microscopy and instrumentation
- Lectures on electron sources, electron lenses and probe formation
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM
- Brief description and demonstration of the SEM microscope
- Practice on beam/specimen interaction, image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping
- Practice on real-world samples and report results
Literatur- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
327-2140-00LFocused Ion Beam and Applications Belegung eingeschränkt - Details anzeigen
Number of participants limited to 6. PhD students will be asked for a fee. https://scopem.ethz.ch/education/MTP.html

Registration form: (Link)
1 KP2PP. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler
KurzbeschreibungThe introductory course on Focused Ion Beam (FIB) provides theoretical and hands-on learning for new operators, utilizing lectures, demonstrations and hands-on sessions.
Lernziel- Set-up, align and operate a FIB-SEM successfully and safely.
- Accomplish operation tasks and optimize microscope performances.
- Perform sample preparation (TEM lamella, APT probe…) using FIB-SEM.
- Perform other FIB techniques, such as characterization
- At the end of the course, students will know how to set-up FIB-SEM, how to prepare TEM lamella/APT probe and how to utilize FIB techniques.
InhaltThis course provides FIB techniques to students with previous SEM experience.
- Overview of FIB theory, instrumentation, operation and applications.
- Introduction and discussion on FIB and instrumentation.
- Lectures on FIB theory.
- Lectures on FIB applications.
- Practicals on FIB-SEM set-up, cross-beam alignment.
- Practicals on site-specific cross-section and TEM lamellar preparation.
- Lecture and demonstration on FIB automation.
Literatur- Detailed course manual.
- Giannuzzi, Stevie: Introduction to focused ion beams instrumentation, theory, techniques, and practice, Springer, 2005.
- Orloff, Utlaut, Swanson: High resolution focused ion beams: FIB and its applications, Kluwer Academic/Plenum Publishers, 2003.
Voraussetzungen / BesonderesThe students should fulfil one or more of these prerequisites:
- Prior attendance to the ScopeM Microscopy Training SEM I: Introduction to SEM (327-2125-00L).
- Prior SEM experience.