Autumn Semester 2020 takes place in a mixed form of online and classroom teaching.
Please read the published information on the individual courses carefully.

Karsten Kunze: Catalogue data in Autumn Semester 2016

Name Dr. Karsten Kunze
ETH Zürich, HPM D 46
Otto-Stern-Weg 3
8093 Zürich
Telephone+41 44 632 56 95
DepartmentEarth Sciences

327-0702-00LEM-Practical Course in Materials Science2 credits4PK. Kunze, F. Gramm, F. Krumeich, J. Reuteler
AbstractPractical work on a TEM and on SEM, treatment of typical problems, data analysis, writing of a report
ObjectiveApplication of basic electron microscopic techniques to materials science problems
Literaturesee lecture Electron Microscopy (327-0703-00L)
Prerequisites / NoticePrerequisite: the lecture Electron Microscopy (327-0703-00L) has to be attended with success, maximum number of participants 15, work in groups of 3 people.
327-0703-00LElectron Microscopy in Material Science4 credits2V + 2UK. Kunze, R. Erni, S. Gerstl, F. Gramm, F. Krumeich
AbstractA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
ObjectiveA comprehensive understanding of the interaction of electrons with condensed matter and details on the instrumentation and methods designed to use these probes in the structural and chemical analysis of various materials.
ContentThis course provides a general introduction into electron microscopy of organic and inorganic materials. In the first part, the basics of transmission- and scanning electron microscopy are presented. The second part includes the most important aspects of specimen preparation, imaging and image processing. In the third part, recent applications in materials science, solid state physics, structural biology, structural geology and structural chemistry will be reported.
Lecture notesEnglisch
LiteratureTransmission Electron Microscopy, L. Reimer; Einführung in die Elektronenmikroskopie, M. v. Heimendahl. Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996. Hawkes, Valdrè: Biophysical Electron Microscopy, Academic Press, 1990.
Frank: Electron Tomography, Plenum Press, 1992.
Erni: Aberration-corrected imaging in transmission electron microscopy, Imperial College Press (2010, and 2nd ed. 2015)
327-2125-00LMicroscopy Training SEM I - Introduction to SEM Restricted registration - show details
Number of participants limited to 6.
The participants will be chosen based on a short motivation letter. Please send this letter to S. Rodighiero (main lecturer) as soon as possible.
1 credit3PS. Rodighiero, A. G. Bittermann, K. Kunze, J. Reuteler
AbstractThe introductory course on Scanning Electron Microscopy (SEM) emphasizes hands-on learning. Using 2 SEM instruments, students have the opportunity to study their own samples, or standard test samples, as well as solving exercises provided by ScopeM scientists.
Objective- Set-up, align and operate a SEM successfully and safely.
- Accomplish imaging tasks successfully and optimize microscope performances.
- Master the operation of a low-vacuum and field-emission SEM and EDX instrument.
- Perform sample preparation with corresponding techniques and equipment for imaging and analysis
- Acquire techniques in obtaining secondary electron and backscatter electron micrographs
- Perform EDX qualitative and semi-quantitative analysis
ContentDuring the course, students learn through lectures, demonstrations, and hands-on sessions how to setup and operate SEM instruments, including low-vacuum and low-voltage applications.
This course gives basic skills for students new to SEM. At the end of the course, students with no prior experience are able to align a SEM, to obtain secondary electron (SE) and backscatter electron (BSE) micrographs and to perform energy dispersive X-ray spectroscopy (EDX) qualitative and semi-quantitative analysis. The procedures to better utilize SEM to solve practical problems and to optimize SEM analysis for a wide range of materials will be emphasized.

- Discussion of students' sample/interest
- Introduction and discussion on Electron Microscopy and instrumentation
- Lectures on electron sources, electron lenses and probe formation
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM
- Brief description and demonstration of the SEM microscope
- Practice on beam/specimen interaction, image formation, image contrast (and image processing)
- Student participation on sample preparation techniques
- Scanning Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities
- Lecture and demonstrations on X-ray micro-analysis (theory and detection), qualitative and semi-quantitative EDX and point analysis, linescans and spectral mapping
- Practice on real-world samples and report results
Literature- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Prerequisites / NoticeNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.
651-1851-00LIntroduction to Scanning Electron Microscopy
Does not take place this semester.
1 credit2GK. Kunze, L. Martin
ObjectiveIntroduction in scanning electron microscopy and microanalysis. Obtain practical experience in operating a SEM.
ContentFunctional principles and operation modes of a scanning electron microscope. Methods and application fields for
- imaging (SE, BSE, FSE, AE, CL),
- X-ray spectroscopy (EDX)
- Electron diffraction (EBSD, Channeling, Orientation Imaging).
Methods for sample preparation
Practical exercises.
Lecture notesScripts and operation manuals are provided during the course.
Literature- Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996).
- Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994).
- Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973).
- Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981).
Prerequisites / NoticeFull day block course after the end of HS
651-4111-00LRock Physics Information 3 credits2GA. S. Zappone, K. Kunze, C. Madonna
AbstractThe modern discipline of Rock Physics serves as a bridge between traditional Rock Mechanics and traditional Rock Physical Property measurement. Through understanding the physics of the process, we strive to better understand other related fields such as structural geology and geophysics.
ObjectiveThe objective of this course is to introduce Rock Physics as a laboratory and interpretive tool.
ContentThe course will consists of regular classes, with a small number of laboratory demonstrations made on an ad-hoc basis (depending on equipment and research objective schedules at the Rock Deformation Laboratory). The course will cover measurements of physical properties of rock such as density, porosity, permeability and elastic wave velocity, and will introduce the concept of seismic seismic anisotropy etc. Later we will cover rock deformation in the brittle field, earthquake physics and triggering. Finally we will discuss scale effects as we move from small scale laboratory environment to the scale of the geophysical investigation.
Prerequisites / NoticeUndergraduate courses in the following subjects are highly recommended in order to get the most out of this specialist course:

- Basic structural Geology
- Geophysics