327-2135-00L Advanced Analytical TEM
Semester | Spring Semester 2018 |
Lecturers | A. Sologubenko, R. Erni, R. Schäublin |
Periodicity | yearly recurring course |
Language of instruction | English |
Courses
Number | Title | Hours | Lecturers | ||||||||||
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327-2135-00 G | Advanced Analytical TEM This block course will take place on 05.- 09.03.2018. On 08.03. the course will take place at Empa. Students who wish to obtain ECTS points need to participate at additional hands-on sessions at ScopeM and Empa (limited to 12 students). A separate registration is necessary. | 40s hrs |
| A. Sologubenko, R. Erni, R. Schäublin |
Catalogue data
Abstract | The course focuses on the fundamental understanding and hands-on knowledge of analytical Transmission Electron Microscopy (ATEM) techniques: electron dispersive X-ray analysis (EDX), energy filtered TEM and electron energy loss spectroscopy (EELS). The lectures will be followed by demonstrations and acquisition sessions TEM instruments.The lectures on statistical treatment of raw data sets and on |
Objective | • Setting-up the optimal operation conditions for reliable EDX analysis and quantification. • Setting-up the optimal operation conditions for the reliable EFTEM analyses. • Setting-up the optimal operation conditions for the reliable EELS analyses. • EDX data acquisition, on-line analysis and quantification. • EFTEM data acquisition and analysis. • EELS acquisition analyses. |
Content | 1. Fundamentals of analytical TEM. 2. Electron Optics and Instrumentation. Spectrum Imaging. 3. Quantitative X-ray Spectrometry. 4. EELS. 5. EFTEM. 6. Statistical treatment of raw data. 7. EDX. Quantification and data evaluation. 8. Demonstrations on EDX, EELS, and EFTEM data acquisitions. 9. Practical sessions for students with provided specimens. Practical sessions for students with their own specimens. 10. Questions and such: open discussion. 11. Student presentations. |
Literature | • Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 • Williams, Carter: Transmission Electron Microscopy, Plenum Press, 2nd Edition 2009 • Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscopy, 3rd Edition, Springer, 2011. |
Prerequisites / Notice | No mandatory prerequisites. Prior attendance to EM Basic lectures (327-0703-00L, 227- 0390-00L) and to the Microscopy Training TEM I - Introduction to TEM course (327-2126- 00L) is recommended. |
Performance assessment
Performance assessment information (valid until the course unit is held again) | |
Performance assessment as a semester course | |
ECTS credits | 2 credits |
Examiners | R. Erni, R. Schäublin, A. Sologubenko |
Type | ungraded semester performance |
Language of examination | German |
Repetition | Repetition only possible after re-enrolling for the course unit. |
Learning materials
No public learning materials available. | |
Only public learning materials are listed. |
Groups
No information on groups available. |
Restrictions
Places | Limited number of places. Special selection procedure. |
Waiting list | until 02.03.2018 |
End of registration period | Registration only possible until 23.02.2018 |
Offered in
Programme | Section | Type | |
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Materials Science Master | Elective Courses | W Dr |