327-2135-00L  Advanced Analytical TEM

SemesterSpring Semester 2018
LecturersA. Sologubenko, R. Erni, R. Schäublin
Periodicityyearly recurring course
Language of instructionEnglish



Courses

NumberTitleHoursLecturers
327-2135-00 GAdvanced Analytical TEM
This block course will take place on 05.- 09.03.2018. On 08.03. the course will take place at Empa.

Students who wish to obtain ECTS points need to participate at additional hands-on sessions at ScopeM and Empa (limited to 12 students). A separate registration is necessary.
40s hrs
05.03.08:45-12:30HIT K 52 »
06.03.12:45-16:30HIT K 52 »
09.03.12:45-15:30HIT K 52 »
A. Sologubenko, R. Erni, R. Schäublin

Catalogue data

AbstractThe course focuses on the fundamental understanding and hands-on knowledge of analytical Transmission Electron Microscopy (ATEM) techniques: electron dispersive X-ray analysis (EDX), energy filtered TEM and electron energy loss spectroscopy (EELS). The lectures will be followed by demonstrations and acquisition sessions TEM instruments.The lectures on statistical treatment of raw data sets and on
Objective• Setting-up the optimal operation conditions for reliable EDX analysis and quantification.
• Setting-up the optimal operation conditions for the reliable EFTEM analyses.
• Setting-up the optimal operation conditions for the reliable EELS analyses.
• EDX data acquisition, on-line analysis and quantification.
• EFTEM data acquisition and analysis.
• EELS acquisition analyses.
Content1. Fundamentals of analytical TEM.
2. Electron Optics and Instrumentation. Spectrum Imaging.
3. Quantitative X-ray Spectrometry.
4. EELS.
5. EFTEM.
6. Statistical treatment of raw data.
7. EDX. Quantification and data evaluation.
8. Demonstrations on EDX, EELS, and EFTEM data acquisitions.
9. Practical sessions for students with provided specimens. Practical sessions for
students with their own specimens.
10. Questions and such: open discussion.
11. Student presentations.
Literature• Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
• Williams, Carter: Transmission Electron Microscopy, Plenum Press, 2nd Edition 2009
• Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscopy, 3rd Edition,
Springer, 2011.
Prerequisites / NoticeNo mandatory prerequisites. Prior attendance to EM Basic lectures (327-0703-00L, 227- 0390-00L) and to the Microscopy Training TEM I - Introduction to TEM course (327-2126- 00L) is recommended.

Performance assessment

Performance assessment information (valid until the course unit is held again)
Performance assessment as a semester course
ECTS credits2 credits
ExaminersR. Erni, R. Schäublin, A. Sologubenko
Typeungraded semester performance
Language of examinationGerman
RepetitionRepetition only possible after re-enrolling for the course unit.

Learning materials

No public learning materials available.
Only public learning materials are listed.

Groups

No information on groups available.

Restrictions

PlacesLimited number of places. Special selection procedure.
Waiting listuntil 02.03.2018
End of registration periodRegistration only possible until 23.02.2018

Offered in

ProgrammeSectionType
Materials Science MasterElective CoursesW DrInformation