327-2126-00L  Microscopy Training TEM I - Introduction to TEM

SemesterHerbstsemester 2016
Dozierende
Periodizitätjedes Semester wiederkehrende Veranstaltung
LehrveranstaltungFindet dieses Semester nicht statt.
LehrspracheEnglisch
KommentarNumber of participants limited to 6.

The participants will be chosen based on a short motivation letter. Please send this letter to S. Rodighiero (main lecturer).



Katalogdaten

KurzbeschreibungDer Einführungskurs in Transmissionselektronenmikroskopie (TEM) bietet neuen Nutzern die Möglichkeit theoretisches Wissen und praktische Kenntnisse in TEM zu erwerben
Lernziel- Overview of TEM theory, instrumentation, operation and applications.
- Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully.
- Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras.
- To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns.
- Overview of techniques for specimen preparation.
InhaltUsing two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods.

- Introduction and discussion on Electron Microscopy and instrumentation.
- Lectures on electron sources, electron lenses and probe formation.
- Lectures on beam/specimen interaction, image formation, image contrast and imaging modes.
- Lectures on sample preparation techniques for EM.
- Brief description and demonstration of the TEM microscope.
- Practice on beam/specimen interaction, image formation, Image contrast (and image processing).
- Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM).
- Student participation on sample preparation techniques.
- Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities.
- TEM alignment, calibration, correction to improve image contrast and quality.
- Electron diffraction.
- Practice on real-world samples and report results.
Literatur- Detailed course manual
- Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996
- Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990
- Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007
Voraussetzungen / BesonderesNo mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite.

Leistungskontrolle

Information zur Leistungskontrolle (gültig bis die Lerneinheit neu gelesen wird)
Leistungskontrolle als Semesterkurs
ECTS Kreditpunkte1 KP
PrüfendeF. Gramm, E. J. Barthazy Meier, A. G. Bittermann, S. Rodighiero
Formunbenotete Semesterleistung
PrüfungsspracheEnglisch
RepetitionRepetition nur nach erneuter Belegung der Lerneinheit möglich.
Zusatzinformation zum PrüfungsmodusOral presentation and discussion about the TEM/STEM images and results obtained during the course.

Lernmaterialien

Keine öffentlichen Lernmaterialien verfügbar.
Es werden nur die öffentlichen Lernmaterialien aufgeführt.

Lehrveranstaltungen

NummerTitelUmfangDozierende
327-2126-00 PMicroscopy Training TEM I - Introduction to TEM
Findet dieses Semester nicht statt.
This block course will take place from 7th-11th November 2016.
35s Std.

Gruppen

Keine Informationen zu Gruppen vorhanden.

Einschränkungen

PlätzePlätze beschränkt. Spezielles Auswahlverfahren.
WartelisteBis 24.10.2016
BelegungsendeBelegung nur bis 03.10.2016 möglich

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