651-1851-00L Introduction to Scanning Electron Microscopy
Semester | Autumn Semester 2016 |
Lecturers | K. Kunze, L. Martin |
Periodicity | yearly recurring course |
Course | Does not take place this semester. |
Language of instruction | German |
Abstract | |
Objective | Introduction in scanning electron microscopy and microanalysis. Obtain practical experience in operating a SEM. |
Content | Functional principles and operation modes of a scanning electron microscope. Methods and application fields for - imaging (SE, BSE, FSE, AE, CL), - X-ray spectroscopy (EDX) - Electron diffraction (EBSD, Channeling, Orientation Imaging). Methods for sample preparation Practical exercises. |
Lecture notes | Scripts and operation manuals are provided during the course. |
Literature | - Reed: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press (1996). - Schmidt: Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse. Expert-Verlag Renningen-Malmsheim (1994). - Reimer, Pfefferkorn: Rasterelektronenmikroskopie. Springer Berlin (1973). - Goldstein et al: Scanning Elektron Microscopy and X-Ray Microanalysis. Plenum Press New York London (1981). |
Prerequisites / Notice | Full day block course after the end of HS |