327-2132-00L  Multifunctional Ferroic Materials: Growth, Characterisation, Simulation

SemesterAutumn Semester 2018
LecturersM. Trassin, M. Fiebig
Periodicityyearly recurring course
Language of instructionEnglish



Courses

NumberTitleHoursLecturers
327-2132-00 GMultifunctional Ferroic Materials: Growth and Characterization2 hrs
Mon13-15HCI H 8.1 »
M. Trassin, M. Fiebig

Catalogue data

AbstractThe course will explore the growth of (multi-) ferroic oxide thin films. The structural characterization and ferroic state investigation by force microscopy and by laser-optical techniques will be addressed.
Oxide electronics device concepts will be discussed.
ObjectiveOxide films with a thickness of just a few atoms can now be grown with a precision matching that of semiconductors. This opens up a whole world of functional device concepts and fascinating phenomena that would not occur in the expanded bulk crystal. Particularly interesting phenomena occur in films showing magnetic or electric order or, even better, both of these ("multiferroics").

In this course students will obtain an overarching view on oxide thin epitaxial films and heterostructures design, reaching from their growth by pulsed laser deposition to an understanding of their magnetoelectric functionality from advanced characterization techniques. Students will therefore understand how to fabricate and characterize highly oriented films with magnetic and electric properties not found in nature.
ContentTypes of ferroic order, multiferroics, oxide materials, thin-film growth by pulsed laser deposition, molecular beam epitaxy, RF sputtering, structural characterization (reciprocal space - basics-, XRD for thin films, RHEED) epitaxial strain related effects, scanning probe microscopy techniques, laser-optical characterization, oxide thin film based devices and examples.

Performance assessment

Performance assessment information (valid until the course unit is held again)
Performance assessment as a semester course
ECTS credits2 credits
ExaminersM. Trassin, M. Fiebig
Typeend-of-semester examination
Language of examinationEnglish
RepetitionA repetition date will be offered in the first two weeks of the semester immediately consecutive.
Additional information on mode of examination30 min oral examination

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Doctoral Dep. of Information Technology and Electrical EngineeringDoctoral and Post-Doctoral CoursesWInformation
Electrical Engineering and Information Technology MasterRecommended SubjectsWInformation
Electrical Engineering and Information Technology MasterSpecialization CoursesWInformation
Materials Science MasterElective CoursesWInformation
Physics MasterGeneral ElectivesWInformation