Alla Sologubenko: Katalogdaten im Frühjahrssemester 2023 |
| Name | Frau Dr. Alla Sologubenko |
| Adresse | ScopeM ETH Zürich, HPM C 57.3 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telefon | +41 44 633 68 12 |
| alla.sologubenko@scopem.ethz.ch | |
| URL | https://scopem.ethz.ch/ |
| Departement | Materialwissenschaft |
| Beziehung | Dozentin |
| Nummer | Titel | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|
| 227-0390-00L | Elements of Microscopy | 4 KP | 3G | M. Stampanoni, G. Csúcs, A. Sologubenko | |
| Kurzbeschreibung | The lecture reviews the basics of microscopy by discussing wave propagation, diffraction phenomena and aberrations. It gives the basics of light microscopy, introducing fluorescence, wide-field, confocal and multiphoton imaging. It further covers 3D electron microscopy and 3D X-ray tomographic micro and nanoimaging. | ||||
| Lernziel | Solid introduction to the basics of microscopy, either with visible light, electrons or X-rays. | ||||
| Inhalt | It would be impossible to imagine any scientific activities without the help of microscopy. Nowadays, scientists can count on very powerful instruments that allow investigating sample down to the atomic level. The lecture includes a general introduction to the principles of microscopy, from wave physics to image formation. It provides the physical and engineering basics to understand visible light, electron and X-ray microscopy. During selected exercises in the lab, several sophisticated instrument will be explained and their capabilities demonstrated. | ||||
| Literatur | Available Online. | ||||
| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM  Number of participants limited to 6. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee: (http://www.scopem.ethz.ch/education/MTP0.html). TEM 1 registration form: (Link) | 2 KP | 3P | P. Zeng, E. J. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko | |
| Kurzbeschreibung | Der Einführungskurs in Transmissionselektronenmikroskopie (TEM) bietet neuen Nutzern die Möglichkeit theoretisches Wissen und praktische Kenntnisse in TEM zu erwerben | ||||
| Lernziel | - Overview of TEM theory, instrumentation, operation and applications. - Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully. - Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras. - To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns. - Overview of techniques for specimen preparation. | ||||
| Inhalt | Using two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods. - Introduction and discussion on Electron Microscopy and instrumentation. - Lectures on electron sources, electron lenses and probe formation. - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM. - Brief description and demonstration of the TEM microscope. - Practice on beam/specimen interaction, image formation, Image contrast (and image processing). - Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM). - Student participation on sample preparation techniques. - Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities. - TEM alignment, calibration, correction to improve image contrast and quality. - Electron diffraction. - Practice on real-world samples and report results. | ||||
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
| Voraussetzungen / Besonderes | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | ||||
| 327-2128-00L | High Resolution Transmission Electron Microscopy Limited number of participants. More information here: https://scopem.ethz.ch/education/MTP0.html Registration form: (Link) | 2 KP | 3G | A. Sologubenko, R. Erni, R. Schäublin, P. Zeng | |
| Kurzbeschreibung | Dieser Fortgeschrittenenkurs für hochauflösende Transmissionselektronenmikroskopie (HRTEM) bietet Vorlesungen, die sich auf HRTEM- und HRSTEM-Bildgebungsprinzipien, die zugehörige Datenanalyse und Simulation, sowie Phasenwiederherstellungsmethoden konzentrieren. | ||||
| Lernziel | - Learning how HRTEM and HRSTEM images are obtained. - Learning about the aberrations affecting the resolution in TEM and STEM and the different methods to correct them. - Learning about TEM and STEM images simulation software. - Performing TEM and STEM image analysis (processing of TEM images and phase restoration after focal series acquisitions). | ||||
| Inhalt | This course provides new skills to students with previous TEM experience. At the end of the course, students will know how to obtain HR(S)TEM images, how to analyse, process and simulate them. Topics: 1. Introduction to HRTEM and HRSTEM 2. Considerations on (S)TEM instrumentation for high resolution imaging 3. Lectures on aberrations, aberration correction and aberration corrected images 4. HRTEM and HRSTEM simulation 5. Data analysis, phase restoration and lattice-strain analysis | ||||
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, 2nd ed., Springer, 2009 - Williams, Carter (eds.), Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry, Springer 2016 - Erni, Aberration-corrected imaging in transmission electron microscopy, 2nd ed., Imperial College Press, 2015. - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||
| Voraussetzungen / Besonderes | The students should fulfil one or more of these prerequisites: - Prior attendance to the ScopeM TEM basic course - Prior attendance to ETH EM lectures (327-0703-00L Electron Microscopy in Material Science) - Prior TEM experience | ||||