Stephan Handschin: Katalogdaten im Frühjahrssemester 2024 |
| Name | Herr Stephan Handschin |
| Adresse | ScopeM ETH Zürich, HPM C 55.2 Otto-Stern-Weg 3 8093 Zürich SWITZERLAND |
| Telefon | +41 44 632 39 42 |
| stephan.handschin@scopem.ethz.ch | |
| Departement | Materialwissenschaft |
| Beziehung | Dozent |
| Nummer | Titel | ECTS | Umfang | Dozierende | |||||||||||||||||||||||||||||||||||||||||
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| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM  The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. Master students will have priority over PhD students. PhD students may still enroll, but will be asked for a fee: https://scopem.ethz.ch/education/MTP.html TEM 1 registration form: Link | 2 KP | 3P | P. Zeng, E. J. Barthazy Meier, C. Bebeacua, A. G. Bittermann, F. Gramm, S. Handschin, M. Peterek, B. Qureshi, A. Sologubenko | |||||||||||||||||||||||||||||||||||||||||
| Kurzbeschreibung | Der Einführungskurs in Transmissionselektronenmikroskopie (TEM) bietet neuen Nutzern die Möglichkeit theoretisches Wissen und praktische Kenntnisse in TEM zu erwerben | ||||||||||||||||||||||||||||||||||||||||||||
| Lernziel | - Overview of TEM theory, instrumentation, operation and applications. - Alignment and operation of a TEM, as well as acquisition and interpretation of images, diffraction patterns, accomplishing basic tasks successfully. - Knowledge of electron imaging modes (including Scanning Transmission Electron Microscopy), magnification calibration, and image acquisition using CCD cameras. - To set up the TEM to acquire diffraction patterns, perform camera length calibration, as well as measure and interpret diffraction patterns. - Overview of techniques for specimen preparation. | ||||||||||||||||||||||||||||||||||||||||||||
| Inhalt | Using two Transmission Electron Microscopes the students learn how to align a TEM, select parameters for acquisition of images in bright field (BF) and dark field (DF), perform scanning transmission electron microscopy (STEM) imaging, phase contrast imaging, and acquire electron diffraction patterns. The participants will also learn basic and advanced use of digital cameras and digital imaging methods. - Introduction and discussion on Electron Microscopy and instrumentation. - Lectures on electron sources, electron lenses and probe formation. - Lectures on beam/specimen interaction, image formation, image contrast and imaging modes. - Lectures on sample preparation techniques for EM. - Brief description and demonstration of the TEM microscope. - Practice on beam/specimen interaction, image formation, Image contrast (and image processing). - Demonstration of Transmission Electron Microscopes and imaging modes (Phase contrast, BF, DF, STEM). - Student participation on sample preparation techniques. - Transmission Electron Microscopy lab exercises: setup and operate the instrument under various imaging modalities. - TEM alignment, calibration, correction to improve image contrast and quality. - Electron diffraction. - Practice on real-world samples and report results. | ||||||||||||||||||||||||||||||||||||||||||||
| Literatur | - Detailed course manual - Williams, Carter: Transmission Electron Microscopy, Plenum Press, 1996 - Hawkes, Valdre: Biophysical Electron Microscopy, Academic Press, 1990 - Egerton: Physical Principles of Electron Microscopy: an introduction to TEM, SEM and AEM, Springer Verlag, 2007 | ||||||||||||||||||||||||||||||||||||||||||||
| Voraussetzungen / Besonderes | No mandatory prerequisites. Please consider the prior attendance to EM Basic lectures (551- 1618-00V; 227-0390-00L; 327-0703-00L) as suggested prerequisite. | ||||||||||||||||||||||||||||||||||||||||||||
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