Suchergebnis: Lerneinheiten im Herbstsemester 2023
Materialwissenschaft Master  | ||||||
 Kernfächer | ||||||
| Nummer | Titel | Typ | ECTS | Umfang | Dozierende | |
|---|---|---|---|---|---|---|
| 327-0505-00L | Surfaces and Interfaces I: Fundamentals, Analytics and Applications Extended course starting HS23. Old title: Surfaces, Interfaces and their Applications I. Students who obtained credit points for the old course cannot retake it. | W Dr | 6 KP | 3G | L. Isa, M. P. Heuberger | |
| 327-0703-00L | Electron Microscopy in Material Science | W | 4 KP | 2V + 2U | S. Gerstl, R. Erni, F. Gramm, A. Käch, F. Krumeich, K. Kunze | |
| 327-1204-00L | Materials at Work I | W Dr | 4 KP | 4S | R. Spolenak, R. Koopmans | |
| 327-1207-00L | Soft Materials Engineering and Characterization | W Dr | 5 KP | 4G | J. Vermant, L. Isa | |
| 327-1221-00L | Biological and Bio-Inspired Materials | W | 6 KP | 6G | A. R. Studart, I. Burgert, R. Nicolosi Libanori, G. Panzarasa, M. Steinacher | |
| 327-2143-00L | Computational Multi-Scale Modeling of Solids Findet dieses Semester nicht statt. | W | 5 KP | 5G | P. Derlet | |
| 327-2208-00L | Order in Materials | W Dr | 5 KP | 4G | M. Fiebig, A. Simonov | |
| 327-2210-00L | Thin Films Technology - From Fundamentals to Oxide Electronics Students who already took "327-2104-00L Inorganic Thin Films: Processing, Properties and Applications" AND "327-2132-00 Multifunctional Ferroic Materials: Growth and Characterisation" are not allowed to attend this course. | W Dr | 4 KP | 4G | M. Trassin, C. Schneider | |
| 402-0535-00L | Introduction to Magnetism | W | 6 KP | 3G | A. Vindigni | |
| Wahlfächer Den Studierenden steht das gesamte Lehrangebot der ETH Zürich auf Master-Stufe zur Auswahl offen. Bitte wenden Sie sich bei Unklarheiten ans Studiensekretariat. | ||||||
| Nummer | Titel | Typ | ECTS | Umfang | Dozierende | |
| 327-0702-00L | EM-Practical Course in Materials Science | W | 2 KP | 4P | K. Kunze, S. Gerstl, F. Gramm, F. Krumeich, J. Reuteler | |
| 327-1101-00L | Biomineralization Findet dieses Semester nicht statt. | W | 2 KP | 2V | ||
| 327-2103-00L | Composites and Hybrids: From Design to Application | W | 5 KP | 3V + 1U | F. J. Clemens, B. Weisse, A. Winistörfer | |
| 327-2125-00L | Microscopy Training SEM I - Introduction to SEM  The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (https://scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | W | 2 KP | 3P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, K. Kunze, F. Lucas, J. Reuteler | |
| 327-2126-00L | Microscopy Training TEM I - Introduction to TEM The number of participants is limited. In case of overbooking, the course will be repeated once. All registrations will be recorded on the waiting list. For PhD students, postdocs and others, a fee will be charged (https://scopem.ethz.ch/education/MTP.html). All applicants must additionally register on this form: Link The selected applicants will be contacted and asked for confirmation a few weeks before the course date. | W | 2 KP | 3P | P. Zeng, E. Barthazy Meier, A. G. Bittermann, F. Gramm, A. Sologubenko | |
| 327-2127-00L | Sustainable Materials Management: Concepts, Methods and Principles | W | 2 KP | 1V + 1U | P. Wäger | |
| 327-2128-00L | High Resolution Transmission Electron Microscopy Findet dieses Semester nicht statt. Limited number of participants. More information here: https://scopem.ethz.ch/education/MTP.html Registration form: Link | W | 2 KP | 3G | R. Erni | |
| 327-2129-00L | Nanocharacterization using Analytical Electron Microscopy Form for registration: Link | W | 1 KP | 2P | A. Sologubenko, A. Maigné, R. Schäublin, P. Zeng | |
| 327-2136-00L | Chemical Analysis and Spectroscopy for Energy Applications | W Dr | 2 KP | 2G | A. Borgschulte | |
| 327-2137-00L | Scattering Techniques for Material Characterization All enrolled students are initially placed on the “waiting list” until the registration deadline. In the case of more than 12 applicants, the students will be selected by the lecturers before the start of the lecture according to the priority criteria: master students before doctoral students, Material Science students before students of other departments. | W | 4 KP | 2V + 1U | T. Weber, A. Sologubenko | |
| 327-2140-00L | Focused Ion Beam and Applications Number of participants limited to 6. PhD students will be asked for a fee. https://scopem.ethz.ch/education/MTP.html Registration form: Link | W Dr | 1 KP | 2P | P. Zeng, A. G. Bittermann, S. Gerstl, L. Grafulha Morales, J. Reuteler | |
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